Transient and permanent fault diagnosis for FPGA-based TMR systems

IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 1999, Pages 330-338

  D'Angelo, Sergio ^a   Metra, Cecilia ^a   Sechi, Giacomo ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SYSTEMS PROGRAMMING; ELECTRIC FAULT CURRENTS; FIELD PROGRAMMABLE GATE ARRAYS; REDUNDANCY; TRANSIENTS;

TRANSIENT/PERMANENT FAULT DIAGNOSIS; TRIPLE MODULAR REDUNDANCY (TMR) SYSTEMS;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0033339781     PISSN: 10636722     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)