Efficient regression testing of multi-panel systems

Proceedings of the International Symposium on Software Reliability Engineering, ISSRE

Volumn , Issue , 1999, Pages 158-165

  Williams, Clay ^a   Paradkar, Amit ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TELLER MACHINES; INTERACTIVE COMPUTER SYSTEMS; LEGACY SYSTEMS; REGRESSION ANALYSIS; SOFTWARE ENGINEERING; STATISTICAL TESTS; WORLD WIDE WEB;

MULTI-PANEL SYSTEMS; REGRESSION TESTING;

COMPUTER SOFTWARE SELECTION AND EVALUATION;

EID: 0033339559     PISSN: 10719458     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)