Novel X-ray and gamma-ray drift detectors based on silicon and compound semiconductors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3768, Issue , 1999, Pages 249-260

  Iwanczyk, Jan S ^a   Patt, Bradley E ^a   Tull, Carolyn R ^a   MacDonald, Larry R ^a  

^a Photon Imaging Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GAMMA RAY SPECTROMETERS; PHOSPHORS; PHOTODETECTORS; QUANTUM EFFICIENCY; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES; X RAY SPECTROMETERS;

FULL WIDTH AT HALF MAXIMUM (FWHM); LATERAL DRIFT DETECTORS (LDD); SEMICONDUCTOR DETECTORS; SILICON DRIFT DETECTORS (SDD); SILICON DRIFT PHOTODETECTORS (SDP);

DRIFT CHAMBERS;

EID: 0033338996     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.366589     Document Type: Conference Paper

References (24)