Crystallization and amorphization studies on a Ge2Sb2Te5 thin film sample using a two-laser static tester

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3864, Issue , 1999, Pages 211-213

  Khulbe, Pramod K ^a   Xun, Xiaodong ^a   Mansuripur, M ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; CRYSTALLIZATION; DIELECTRIC MATERIALS; GERMANIUM COMPOUNDS; MICROSCOPIC EXAMINATION; OPTICAL DISK STORAGE; OPTICAL FILMS; PHASE TRANSITIONS; PULSED LASER APPLICATIONS; THIN FILMS;

TWO-LASER STATIC TESTERS;

VIDEODISKS;

EID: 0033338189     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)