Assessment of selected CERES electronic component survivability under simulated overvoltage conditions

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3750, Issue , 1999, Pages 494-502

  Chapman, John J ^a   Grant, M S ^a   Bockman, J ^a   Clark, V M ^a   Hess, P C ^a  

^a NASA LaRC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLOUDS AND THE EARTH RADIANT ENERGY SYSTEM; DATA ACQUISITION ASSEMBLY; TROPICAL RAINFALL MEASURING MISSION;

ANALOG TO DIGITAL CONVERSION; ATMOSPHERIC RADIATION; BUSBARS; CMOS INTEGRATED CIRCUITS; DATA ACQUISITION; ELECTRIC POTENTIAL; MONOLITHIC INTEGRATED CIRCUITS; POWER CONVERTERS; RAIN; SENSORS;

SPACECRAFT OBSERVATORIES;

EID: 0033337222     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)