The Miniaturization of speckle interferometry for rapid strain analysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3824, Issue , 1999, Pages 30-37

  Wegner, Ronny ^a   Ettemeyer, Andreas ^a  

^a Dr Ettemeyer GmbH and Co (Germany)   (Germany)

Author keywords

bending; component testing; contouring; deformation; ESPI; full field measurement; material analysis; miniaturization; speckle; speckle interferometry; strain; strain gauge; strain gradients; stress

Indexed keywords

ACCIDENT PREVENTION; BENDING (DEFORMATION); BENDING (FORMING); DAMAGE DETECTION; DEFORMATION; FATIGUE TESTING; INTERFEROMETERS; MATERIALS TESTING; MINIATURE INSTRUMENTS; OPTICAL DATA PROCESSING; OPTICAL TESTING; RELIABILITY ANALYSIS; SPECKLE; STRAIN; STRAIN GAGES; STRESS MEASUREMENT; STRESSES; CONTOUR MEASUREMENT; INTERFEROMETRY; OPTICAL SENSORS; STRAIN MEASUREMENT; STRESS ANALYSIS;

COMPONENT TESTING; CONTOURING; ESPI; FULL-FIELD MEASUREMENT; MATERIAL ANALYSIS; MINIATURIZATION; SPECKLE INTERFEROMETRY; STRAIN GRADIENTS;

INTERFEROMETRY; SPECKLE;

ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; MINIATURIZATION; RAPID STRAIN ANALYSIS;

EID: 0033337136     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.364278     Document Type: Conference Paper

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