Incorporating statistical process control into the team-based TPM environment

1999 IEEE International Symposium on Semiconductor Manufacturing, ISSM 1999 - Conference Proceedings

Volumn , Issue , 1999, Pages 281-284

  Conway, T ^a   Perry, E ^a  

^a CYPRESS SEMICONDUCTOR   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MANUFACTURE; PROCESS CONTROL; SEMICONDUCTOR DEVICE MANUFACTURE; STATISTICAL PROCESS CONTROL;

CROSS-FUNCTIONAL TEAMS; CYPRESS SEMICONDUCTORS; OPTIMAL PERFORMANCE; STATISTICAL PROCESS CONTROLS (SPC); TOTAL PRODUCTIVE MANUFACTURING;

STATISTICAL PROCESS CONTROL; SEMICONDUCTOR DEVICE MANUFACTURE;

TOTAL PRODUCTIVE MANUFACTURING (TPM);

EID: 0033336895     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSM.1999.808790     Document Type: Conference Paper

References (1)

1. T. Conway and G Shaffer, Implementing TPM in a Lean Semiconductor Manufacturing Environment, in Seventh International Syompo.viani on Sent reondmmetor Mooojhctmcring, 7 October, 1998, pp. 385-388.