Design, fabrication and testing of lightweight silicon mirrors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3786, Issue , 1999, Pages 460-467

  Jacoby, Marc T ^a   Montgomery, Edward E IV ^a   Fortini, Arthur J ^a   Goodman, William A ^a  

^a SCHAFER CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BERYLLIUM; CRYOGENICS; FABRICATION; GRAPHITE; INTERFEROMETERS; SEMICONDUCTING SILICON; SILICON CARBIDE; SINGLE CRYSTALS; SUBSTRATES; SURFACE ROUGHNESS; TESTING; THERMODYNAMIC PROPERTIES;

LIGHTWEIGHT SILICON MIRROR; SINGLE CRYSTAL SILICON;

MIRRORS;

EID: 0033336483     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)