Development of an X-ray interferometer for high-resolution phase-contrast X-ray imaging

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 38, Issue 12 B, 1999, Pages

  Hirano, Keiichi ^a   Momose, Atsushi ^a,b  

^a INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^b HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE INTERFERENCE; SURFACE ROUGHNESS; X RAY APPARATUS;

PHASE-CONTRAST X RAY IMAGING; X RAY INTERFEROMETERS;

INTERFEROMETERS;

EID: 0033336110     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.l1556     Document Type: Article

References (7)