Comprehensive secondary electron emission modeling for simulating e-beam collection in MICHELLE

IEEE International Conference on Plasma Science

Volumn , Issue , 1999, Pages 161-

  Dionne, Norman J ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRON BEAMS; ELECTRON SCATTERING; MATHEMATICAL MODELS;

ELECTRON BEAM COLLECTION SYSTEM;

SECONDARY EMISSION;

EID: 0033335554     PISSN: 07309244     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)