Structural and electrical properties of sol-gel deposited WO3 films

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3788, Issue , 1999, Pages 111-119

  Agnihotry, S A ^a   Sharma, Nidhi ^a   Deepa, M ^a   Kishore, Ram ^a   Sood, K N ^a   Sharma, S K ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL MODIFICATION; DEPOSITION; ELECTRIC PROPERTIES; ELECTROCHROMISM; ELECTRON MICROSCOPY; HEAT TREATMENT; INORGANIC ACIDS; PHYSICAL PROPERTIES; SOL-GELS; STRUCTURE (COMPOSITION); TUNGSTEN COMPOUNDS; X RAY DIFFRACTION ANALYSIS;

ELECTROCHROMIC FILM; PEROXOTUNGSTIC ACID; TUNGSTEN OXIDE;

OPTICAL FILMS;

EID: 0033335460     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)