Optical standards over the 20th century

Journal of Optics A: Pure and Applied Optics

Volumn 1, Issue SUPPL., 1999, Pages 776-778

  Baker, L R ^a  

^a NONE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ENGINEERING RESEARCH; RESEARCH AND DEVELOPMENT MANAGEMENT; STANDARDS;

OPTICAL WAVEFRONTS; SURFACE IMPERFECTIONS;

INDUSTRIAL OPTICS;

EID: 0033335369     PISSN: 14644258     EISSN: None     Source Type: Journal    
DOI: 10.1088/1464-4258/1/S/304     Document Type: Article

References (5)

1. Young M 1986 Scratch-and-dig standard revisited Appl. Opt. 25 1922-9
2. Cormier A J 1987 Assessment of current scratch standards Proc. Soc. Photo-Opt. Instrum. Eng. 805 152-9
3. Baker L R 1988 Inspection of surface flaws by comparator microscopy Appl. Opt. 27 4620-5
4. Baker L R 1994 Thresholds for surface imperfections Opt. Eng. 33 2800-1
5. Briers J D 1999 Interferometric optical testing: an interlaboratory comparison J. Opt. A: Pure Appl. Opt. 1 1-14