X-ray diffraction and electron microscopic studies on selenium substituted indium intercalation compounds of tungsten disulphide

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 64, Issue 3, 1999, Pages 143-148

  Mandal, T K ^b   Srivastava, S K ^a   Samantaray, B K ^a   Mathur, B K ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); ELECTRON MICROSCOPY; INDIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SELENIUM COMPOUNDS; STRAIN; SUBSTITUTION REACTIONS; TUNGSTEN COMPOUNDS; X RAY CRYSTALLOGRAPHY;

TUNGSTEN DISULFIDE;

INTERCALATION COMPOUNDS;

EID: 0033334709     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(99)00169-5     Document Type: Article

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