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Volumn 433-435, Issue , 1999, Pages 136-141

Application of parallel factor analysis and X-ray photoelectron spectroscopy to the initial stages in oxidation of aluminium

Author keywords

Aluminium hydride; Aluminium oxide; Oxidation; Surface chemical reaction; XPS

Indexed keywords

ALUMINA; BINDING ENERGY; CHEMICAL ANALYSIS; CURVE FITTING; INTERFACES (MATERIALS); PARALLEL ALGORITHMS; VAPORS; WATER; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0033334507     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00064-3     Document Type: Article
Times cited : (6)

References (14)
  • 1
    • 0000503141 scopus 로고
    • Quantification of AES and XPS
    • D. Briggs, M.P. Seah (Eds.), Wiley, Chichester, UK, chapter 5
    • M.P. Seah, Quantification of AES and XPS, D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis, vol. 1, 2nd edn., Wiley, Chichester, UK, 1990, chapter 5, p. 201.
    • (1990) Practical Surface Analysis, Vol. 1, 2nd Edn. , vol.1 , pp. 201
    • Seah, M.P.1
  • 2
    • 0002740437 scopus 로고
    • (University Microfilms International No. 10,085)
    • R.A. Harshman, UCLA Working Paper in Phonetics 16, 1970, p. 1 (University Microfilms International No. 10,085).
    • (1970) UCLA Working Paper in Phonetics , vol.16 , pp. 1
    • Harshman, R.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.