The effect of cable geometry on the reproducibility of EMC measurements

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 1999, Pages 780-785

  Van Wershoven, Loes ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CABLES; ELECTROMAGNETIC COMPATIBILITY; ELECTRIC IMPEDANCE; ELECTROMAGNETIC FIELD MEASUREMENT; ELECTROMAGNETIC WAVE EMISSION; NEURAL NETWORKS;

CABLE GEOMETRY; CONDUCTED EMISSIONS; EMC MEASUREMENTS; MEASUREMENT UNCERTAINTY; REPRODUCIBILITIES; TRANSFER CHARACTERISTICS;

UNCERTAINTY ANALYSIS; ELECTROMAGNETIC COMPATIBILITY;

ARTIFICIAL MAIN NETWORKS; COUPLING-DECOUPLING NETWORKS; IMPEDANCE STABILIZATION NETWORKS;

EID: 0033334455     PISSN: 10774076     EISSN: 21581118     Source Type: Conference Proceeding    
DOI: 10.1109/ISEMC.1999.810118     Document Type: Conference Paper

References (13)

1. Paul C.R. Introduction to Electromagnetic compatibility, Wiley Interscience, New York, 1992.
2. Worm S.B. On the relation between radiated and conducted RF emission tests, Philips Research, Eindhoven, The Netherlands, Zurich 1999
3. Bronaugh E.L. Mains simulation network (LISN or A m ) uncertainty-how good are your conducted emission measurements, Siemens Bus.Com.Systems, Austin, USA, Zurich 1999.
4. IEC CISPR 14 third ed., 1993 Limits and methods of measurement of radio disturbance characteristics of electrical motor-operated and thermal appliances for household and simular purposes, electric tools and electric apparatus.
5. IEC CISPR 16-1 First ed part 1, 1993, Specification for radio disturbance and immunity measuring apparatus and methods.
6. IEC CISPR 22 amendement2, 1996, Limits and methods of measurements of radio disturbance characteristics of ITE.
7. EN 61000-4-6 first ed. 1996, Testing and measurement techniques, Immunity to conducted disturbances induced by radio-ji-equencyf ields.
8. EN6100043 fust ed. 1995, Testing and measurement techniques, Radiated, radio-ji-equency, EMfield immunity test.
9. CISPWA Applying EMC Compliance Uncertainty Considerations to a conducted emission measurements.
10. Dr. Jasper J. Goedbloed Uncertainties in standardized EMC compliance testing Philips Research, Eindhoven, The Netherlands, Zurich 1999.
11. Mart Coenen, Boris Traa. Acknowledgement Philips Semiconductors, Eindhoven, The Netherlands.
12. David Morgan A handbook for EMC testing and measurement, chapter 11.
13. European cooperation for Accredition of Laboratories EAL-G27, Guidance on the Application of Eh' 45001 and ISOIIEC Guide 25 to Electromagnetic Compatability (EMC) testing, Purpose edition 1, january 1997. 785