Some methods for profile measurement and an application for on-machine measurement

Proceedings of the IEEE International Conference on Systems, Man and Cybernetics

Volumn 4, Issue , 1999, Pages

  Ai, Xiaoyong ^a   Shimizu, Tsuyoshi ^a   Obi, Makoto ^a  

^a UNIVERSITY OF YAMANASHI   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER APPLICATIONS; GRAPH THEORY; MATHEMATICAL MODELS; MEASUREMENT ERRORS; MEASUREMENT THEORY; SCANNING; SURFACE MEASUREMENT;

CONVENTIONAL REVERSAL METHOD; DISPLACEMENT METHOD; IMPROVED DISPLACEMENT METHOD; IMPROVED REVERSAL METHOD; PROFILE MEASUREMENT; SCANNING ERROR; ZERO ADJUSTMENT ERROR;

SENSORS;

EID: 0033332971     PISSN: 08843627     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)