Position-sensitive ionization chamber for diffraction studies at synchrotron sources

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3774, Issue , 1999, Pages 114-121

  Sato, Kazumichi ^a   Toyokawa, Hidenori ^a   Kohmura, Yoshiki ^a   Ishikawa, Tetsuya ^a   Suzuki, Masayo ^a  

^a RIKEN HARIMA INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; ELECTRODES; ERROR CORRECTION; FEEDBACK; LIGHT; PROTEINS; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS; X RAYS;

BACKGAMMON TYPE SEGMENTED ELECTRODES; BEAM STABILIZATION; FEEDBACK CORRECTION SYSTEMS; POSITION SENSITIVE IONIZATION CHAMBER; PROTEIN CRYSTALLOGRAPHY; XRAY BEAMS;

IONIZATION CHAMBERS;

EID: 0033331763     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)