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Volumn 6, Issue , 1999, Pages 4033-4036

Neural network for inverse mapping in eddy current testing

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CRACK PROPAGATION; DATA STRUCTURES; DATABASE SYSTEMS; EDDY CURRENT TESTING; FAILURE ANALYSIS; INVERSE PROBLEMS; RANDOM NUMBER GENERATION; SENSOR DATA FUSION; STATISTICAL METHODS;

EID: 0033331641     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (11)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.