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Volumn 1, Issue , 1999, Pages 727-735
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Optimization of cycle time and utilization in semiconductor test manufacturing using simulation based, on-line, near-real-time scheduling system
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
COMPETITION;
COMPUTER SIMULATION;
ELECTRONIC EQUIPMENT;
MARKETING;
OPTIMIZATION;
PERFORMANCE;
PLANNING;
REAL TIME SYSTEMS;
SCHEDULING;
SEMICONDUCTOR DEVICE TESTING;
SUPERVISORY PERSONNEL;
CYCLE TIME;
MACHINE UTILIZATION;
ON LINE NEAR REAL TIME SCHEDULING SYSTEM;
SEMICONDUCTOR BACK END FLOW;
SEMICONDUCTOR TEST MANUFACTURING;
SEMICONDUCTOR DEVICE MANUFACTURE;
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EID: 0033331613
PISSN: 02750708
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (44)
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References (19)
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