Power loss and junction temperature analysis of power semiconductor devices

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 1, Issue , 1999, Pages 729-734

  Xu, Dewei ^a   Lu, Haiwei ^a   Huang, Lipei ^a   Azuma, Satoshi ^a   Kimata, Masahiro ^a   Uchida, Ryohei ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC LOSSES; ELECTRIC NETWORK TOPOLOGY; ELECTRIC POWER SUPPLIES TO APPARATUS; HEAT RESISTANCE; MATHEMATICAL MODELS; TIME DOMAIN ANALYSIS;

ELECTROTHERMAL CALCULATION; JUNCTION TEMPERATURE ANALYSIS; THERMAL NETWORK;

BIPOLAR TRANSISTORS;

EID: 0033331534     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)