MICROMEGAS : High rate and radiation hardness results

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 2, 1999, Pages 1894-1897

  Puill, G ^a   Derre J ^a   Giomataris, Y ^a   Rebourgeard, Ph ^a  

^a CEA SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; ARGON; ELECTRIC DISCHARGES; GAIN MEASUREMENT; NEON; X RAYS;

MICROMESH; RADIATION HARDNESS;

RADIATION DETECTORS;

EID: 0033330324     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819248     Document Type: Article

References (4)

1. Y. Giomataris, Ph. Rebourgeard, J.P. Robert, G. Charpak, NIM A376 (1996) 29.
2. G. Charpak et al., NIM A412 (1998) 47-60.
3. G. Barouch et al, NIM A423(1999) 32-48.
4. D. Thers, presented at the INPC 98, to be published.