In-situ electrical analysis in view of monitoring the processing of thermoplastics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4017, Issue , 1999, Pages 94-100

  Gonnet, J M ^a   Guillet, J ^a   Ainser, A ^a   Boiteux, G ^a   Fulchiron, R ^a   Seytre, G ^a  

^a UNIVERSITÉ JEAN MONNET   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; CURING; NONDESTRUCTIVE EXAMINATION; PLASTICS EXTRUDERS; THERMOSETS;

IN SITU ELECTRICAL ANALYSIS; MICRODIELECTROMETRY;

THERMOPLASTICS;

EID: 0033330160     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)