ASD IC for the thin gap chambers in the LHC atlas experiment

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 2, 1999, Pages 1871-1875

  Sasaki, Osamu ^a   Yoshida, Mitsuhiro ^b  

^a INSTITUTE OF PARTICLE AND NUCLEAR STUDIES   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); BIPOLAR TRANSISTORS; CAPACITANCE; INTEGRATED CIRCUIT LAYOUT; IONIZATION CHAMBERS; NETWORKS (CIRCUITS); RESISTORS; SILICON WAFERS; SPURIOUS SIGNAL NOISE; THRESHOLD VOLTAGE;

AMPLIFIER SHAPER DISCRIMINATOR; ANALOG MASTER SLICE BIPOLAR TECHNOLOGY; BASELINE RESTORATION CIRCUIT; EQUIVALENT NOISE CHARGE; FORWARD MUON TRIGGER SYSTEM; POWER DISSIPATION; THIN GAP CHAMBERS;

MICROPROCESSOR CHIPS;

EID: 0033328608     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819243     Document Type: Article

References (8)

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