Is sapphire inherently weak in compression at high temperatures?

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3705, Issue , 1999, Pages 12-16

  Savrun, Ender ^a   Toy, Cetin ^a   Scott, William D ^a   Harris, Daniel C ^a  

^a Sienna Technologies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSION TESTING; COMPRESSIVE STRENGTH; CRACK PROPAGATION; CRYSTAL STRUCTURE; DEFECTS; HIGH TEMPERATURE PROPERTIES; MACHINING; SINGLE CRYSTALS; TWINNING;

MACHINING DAMAGE; RHOMBOHEDRAL TWINNING;

SAPPHIRE;

EID: 0033328429     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)