Wide field imaging spectrometer for ESA's future X-ray mission: XEUS

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3766, Issue , 1999, Pages 127-143

  Strueder, Lothar ^a   Hartmann, Robert ^a   Holl, Peter ^a   Kemmer, Josef ^a   Klein, Peter ^a   Krause, Norbert ^a   Lechner, Peter ^a   Lutz, Gerhard ^a   Meidinger, Norbert ^a   Pfeffermann, Elmar ^a   Popp, Martin ^a   Richter, Rainer ^a   Soltau, Heike ^a   Truemper, Joachim ^a   von Zanthier, Christoph ^a  

^a MPI fur Extraterrestrische Physik   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

JUNCTION GATE FIELD EFFECT TRANSISTORS; QUANTUM EFFICIENCY; RADIATION DETECTORS; SATELLITE OBSERVATORIES; SEMICONDUCTING SILICON; SENSORS; SPACE RESEARCH; SPECTRUM ANALYSIS; X RAY SPECTROSCOPY; X RAYS;

ACTIVE PIXEL SENSORS; BACK ILLUMINATION; DEPLETED FIELD EFFECT TRANSISTOR; HIGH RESISTIVITY SILICON; IMAGING X RAY SPECTROMETERS; JFET ELECTRONICS; NARROW FIELD IMAGERS; SILICON DRIFT DETECTORS; WIDE FIELD IMAGERS; X RAY EVOLVING UNIVERSE SPECTROSCOPY MISSION;

X RAY SPECTROMETERS;

EID: 0033327271     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)