Direct emissivity measurements of IR materials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3705, Issue , 1999, Pages 308-315

  Kisler, Yanina ^a   Kupferberg, Lenn ^a   MacKenzie, Gordon ^a   Chen, Chia Ming ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC VARIABLES CONTROL; AERODYNAMICS; LIGHT EMISSION; MAGNESIA; MISSILES; OPTICAL VARIABLES MEASUREMENT; PRESSURE EFFECTS; SAPPHIRE; TEMPERATURE; THERMAL EFFECTS; YTTRIUM COMPOUNDS; ZINC SULFIDE;

DIRECT EMISSIVITY MEASUREMENT; NARROW BAND DIRECT EMISSIVITY TECHNIQUE; YTTRIA;

OPTICAL MATERIALS;

EID: 0033327058     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)