Comparison of the radiation damage induced by thermal neutrons in CdTe and CdZnTe detectors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3768, Issue , 1999, Pages 424-432

  Chirco, P ^a   Morigi, M P ^a   Zanarini, M ^a   Cavallini, A ^a   Fraboni, B ^a   Auricchio, N ^a   Caroli, E ^a   Dusi, W ^a   Fougeres, P ^a   Hage Ali, M ^a   Siffert, P ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRIC CURRENTS; NEUTRON IRRADIATION; NEUTRON SPECTROMETERS; RADIATION DAMAGE; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR COUNTERS;

CADMIUM ZINC TELLURIDE;

PARTICLE DETECTORS;

EID: 0033326991     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.366609     Document Type: Conference Paper

References (7)