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Volumn , Issue , 1999, Pages 966-970

High Frequency Characterization of a Chip Scale BGA Package

Author keywords

[No Author keywords available]

Indexed keywords

BALL GRID ARRAYS; CHIP SCALE PACKAGES; PACKAGING; ELECTROMAGNETIC FIELD THEORY; FREQUENCY DOMAIN ANALYSIS; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE;

EID: 0033326730     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (10)
  • 1
    • 85126893953 scopus 로고    scopus 로고
    • Advanced Packaging March/April
    • Advanced Packaging, "CSPs Continue Growth", March/April, 1998
    • (1998) CSPs Continue Growth
  • 2
    • 85126892897 scopus 로고
    • Ansoft Corporation, Pittsburgh, PA 15219
    • "Maxwell Quick 3D" Reference Manual, Ansoft Corporation, Pittsburgh, PA 15219, 1994
    • (1994) Maxwell Quick 3D Reference Manual
  • 3
    • 85126838178 scopus 로고
    • Ansoft Corporation, Pittsburgh, PA 15219
    • "Maxwell Eminence" Reference Manual, Ansoft Corporation, Pittsburgh, PA 15219, 1994
    • (1994) Maxwell Eminence Reference Manual
  • 4
    • 85126890117 scopus 로고
    • Measuring Package and Interconnect Model Parameters Using Distributed Impedance
    • B. Janko and T. Decher, "Measuring Package and Interconnect Model Parameters Using Distributed Impedance", International Test Conference 1993, paper 20.1, pp. 436-445
    • (1993) International Test Conference , pp. 436-445
    • Janko, B.1    Decher, T.2
  • 5
    • 0028494638 scopus 로고
    • Characterization and Modeling of Multiple Line Interconnections from Time Domain Measurements
    • Sept
    • L.A. Hayden and V.J. Tripathi, "Characterization and Modeling of Multiple Line Interconnections from Time Domain Measurements", IEEE Trans. on Microwave Theory and Tech., pp. 1737-1743, Sept. 1994
    • (1994) IEEE Trans. on Microwave Theory and Tech. , pp. 1737-1743
    • Hayden, L.A.1    Tripathi, V.J.2
  • 6
  • 7
    • 0030148985 scopus 로고    scopus 로고
    • An Experimental Technique for Full Package Inductance Matrix Characterization
    • C.T. Tsai, W.Y. Yip, "An Experimental Technique for Full Package Inductance Matrix Characterization", IEEE Trans. on Comp., Packaging and Manu. Tech., Vol.19, No.2, 1996, pp.338-343.
    • (1996) IEEE Trans. on Comp., Packaging and Manu. Tech. , vol.19 , Issue.2 , pp. 338-343
    • Tsai, C.T.1    Yip, W.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.