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Volumn , Issue , 1999, Pages 698-704
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PC manufacturing test in a high volume environment
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER INTEGRATED MANUFACTURING;
COSTS;
ELECTRONIC EQUIPMENT MANUFACTURE;
ENVIRONMENTAL TESTING;
INTERACTIVE COMPUTER SYSTEMS;
PERSONAL COMPUTERS;
SYSTEMS ANALYSIS;
MANUFACTURING ENVIRONMENT;
SYSTEM TESTING SCHEMES;
COMPUTER TESTING;
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EID: 0033326422
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (0)
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