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Volumn 1999-March, Issue , 1999, Pages 284-287

Breakdown voltage behavior of PET thermoplastics at DC and AC voltages

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; HEAT RESISTANCE; HVDC POWER TRANSMISSION; REINFORCED PLASTICS; THERMOPLASTICS; THERMOSETS; WEIBULL DISTRIBUTION; DEFECTS; ELECTRIC COILS; ELECTRIC CURRENTS; ELECTRIC INSULATION; ELECTRIC POTENTIAL; ELECTRON DEVICES; ENCAPSULATION; POLYESTERS; POLYETHYLENE TEREPHTHALATES;

EID: 0033326257     PISSN: 10910050     EISSN: 1558058X     Source Type: Conference Proceeding    
DOI: 10.1109/SECON.1999.766141     Document Type: Conference Paper
Times cited : (14)

References (12)
  • 1
    • 0029534205 scopus 로고
    • Encapsulation of sensors, solenoid and transformers with engineering thermoplastics
    • Rosemont, Illinois, USA, September 18-21
    • J. F. B. Patterson, T. D. Boyer, H. Shiozawa, "Encapsulation of Sensors, Solenoid and Transformers with Engineering Thermoplastics", Proceedings of Electrical Electronics Insulation Conference, Rosemont, Illinois, USA, pp. 1-5, September 18-21, 1995.
    • (1995) Proceedings of Electrical Electronics Insulation Conference , pp. 1-5
    • Patterson, J.F.B.1    Boyer, T.D.2    Shiozawa, H.3
  • 6
    • 0017524109 scopus 로고
    • Parameter estimation for the weibull distribution
    • August
    • G. C. Stone, R. G. Van Heeswijk, "Parameter Estimation for the Weibull Distribution", IEEE Transactions on Electrical Insulation Vol. EI-12, No. 4, pp. 253-261, August 1977.
    • (1977) IEEE Transactions on Electrical Insulation , vol.EI-12 , Issue.4 , pp. 253-261
    • Stone, G.C.1    Heeswijk, R.G.V.2
  • 7
    • 0020761386 scopus 로고
    • Weibull statistics in dielectric breakdown; theoretical basis, applications and implications
    • June
    • L. A. Dissado, J. C. Fothergili, S. Wolfe, "Weibull Statistics in Dielectric Breakdown; Theoretical Basis, Applications and Implications", IEEE Transactions on Electrical Insulation Vol. EI-19, No. 3, pp. 227-233, June 1984.
    • (1984) IEEE Transactions on Electrical Insulation , vol.EI-19 , Issue.3 , pp. 227-233
    • Dissado, L.A.1    Fothergili, J.C.2    Wolfe, S.3
  • 8
    • 0027540044 scopus 로고
    • Weibull statistics in short-Term dielectric breakdown of thin polyethylene films
    • February
    • C. Chauvet, C. Laurent, "Weibull Statistics in Short- Term Dielectric Breakdown of Thin Polyethylene Films", IEEE Transactions on Electrical Insulation, Vol. EI-28, No. 1, pp. 18-29, February 1993.
    • (1993) IEEE Transactions on Electrical Insulation , vol.EI-28 , Issue.1 , pp. 18-29
    • Chauvet, C.1    Laurent, C.2
  • 9
    • 0027540044 scopus 로고
    • Weibull statistics in short-Term dielectric breakdown of thin polyethylene films
    • June
    • C. Chauvet, C. Laurent, "Weibull Statistics in Short- Term Dielectric Breakdown of Thin Polyethylene Films, IEEE Transactions on Electrical Insulation Vol. EI-28, No. 1, pp. 18-29, June 1984.
    • (1984) IEEE Transactions on Electrical Insulation , vol.EI-28 , Issue.1 , pp. 18-29
    • Chauvet, C.1    Laurent, C.2
  • 10
    • 0021411806 scopus 로고
    • Analysis of weibull distribution for electrical breakdown voltage of stator windings
    • June
    • T. Hakamada, "Analysis of Weibull Distribution for Electrical Breakdown Voltage of Stator Windings", IEEE Transactions on Electrical Insulation Vol. EI-19, No. 2, pp. 114-118, June 1984.
    • (1984) IEEE Transactions on Electrical Insulation , vol.EI-19 , Issue.2 , pp. 114-118
    • Hakamada, T.1
  • 11
    • 0025442738 scopus 로고
    • Estimating the cumulative probability of failure data points to be plotted on weibull and probability papers
    • June
    • J. C. Fothergrill, "Estimating the Cumulative Probability of Failure Data Points to be Plotted on Weibull and Probability Papers", IEEE Transactions on Electrical Insulation, Vol. EI-25, No. 3, pp. 4989-4992, June 1990.
    • (1990) IEEE Transactions on Electrical Insulation , vol.EI-25 , Issue.3 , pp. 4989-4992
    • Fothergrill, J.C.1
  • 12
    • 0017108782 scopus 로고    scopus 로고
    • Graphical estimation methods for weibull distributions
    • G. Cran, "Graphical Estimation Methods for Weibull Distributions", Microelectronics and Reliability, Vol. 15, pp. 47-52, 1996.
    • (1996) Microelectronics and Reliability , vol.15 , pp. 47-52
    • Cran, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.