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Volumn 38, Issue 12 A, 1999, Pages 6624-6628

A new approach for form polycrystalline silicon by excimer laser irradiation with a wide range of energies

Author keywords

Crystal growth; Excimer laser; Grain; Grain boundary; Poly Si; Polycrystalline silicon; Si; Silicon; TFT; Thin film transistor

Indexed keywords

CARRIER MOBILITY; CRYSTAL GROWTH; CRYSTALLIZATION; DEPOSITION; EXCIMER LASERS; FILM PREPARATION; HEATING; IRRADIATION; LASER APPLICATIONS; MELTING; POLYCRYSTALLINE MATERIALS; THIN FILM TRANSISTORS;

EID: 0033326176     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.6624     Document Type: Article
Times cited : (11)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.