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Volumn 38, Issue 12 A, 1999, Pages 6624-6628
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A new approach for form polycrystalline silicon by excimer laser irradiation with a wide range of energies
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Author keywords
Crystal growth; Excimer laser; Grain; Grain boundary; Poly Si; Polycrystalline silicon; Si; Silicon; TFT; Thin film transistor
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Indexed keywords
CARRIER MOBILITY;
CRYSTAL GROWTH;
CRYSTALLIZATION;
DEPOSITION;
EXCIMER LASERS;
FILM PREPARATION;
HEATING;
IRRADIATION;
LASER APPLICATIONS;
MELTING;
POLYCRYSTALLINE MATERIALS;
THIN FILM TRANSISTORS;
LASER ENERGIES;
LASER IRRADIATION;
POLYCRYSTALLINE SILICON;
SILICON FILM;
AMORPHOUS SILICON;
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EID: 0033326176
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.38.6624 Document Type: Article |
Times cited : (11)
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References (5)
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