Phase error distribution and spectral response in silica-based AWG multiplexers

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3803, Issue , 1999, Pages 60-71

  Klekamp, A ^a   Gehler, J ^a   Satzke, K ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CROSSTALK; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INSERTION LOSSES; INTERFEROMETERS; MATHEMATICAL MODELS; OPTICAL SYSTEMS; PHASE SHIFT; SILICA; TRANSFER FUNCTIONS; WAVEGUIDE COMPONENTS; WAVELENGTH DIVISION MULTIPLEXING;

ARRAYED WAVEGUIDE GRATING MULTIPLEXERS; BEAM PROPAGATION METHOD; DENSE WAVELENGTH DIVISION MULTIPLEXING; FLAT TOP PASSBAND CHARACTERISTIC; LOW COHERENCE INTERFEROMETER; PHASE ERROR DISTRIBUTION; POWER DISTRIBUTION COEFFICIENTS; SILICA WAVEGUIDE TECHNOLOGY; WAVEGUIDE TAPERS;

DIFFRACTION GRATINGS;

EID: 0033326093     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (71)