Light emission from MOS tunnel diodes

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1999, Pages 745-748

  Versari, R ^a   Pieracci, A ^a   Manfredi, M ^a   Soncini, G ^a   Bellutti, P ^a   Ricco, B ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRONIC EQUIPMENT TESTING; HOT CARRIERS; LIGHT EMISSION; MOS DEVICES; PHOTONS; POLYSILANES; SEMICONDUCTOR DEVICE MANUFACTURE;

FOWLER-NORDHEIM REGIME; MOS TUNNEL DIODES; PHOTON ENERGY DISTRIBUTIONS; POLYSILICON LAYER;

TUNNEL DIODES;

EID: 0033324931     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)