`Gated-diode' in SOI MOSFET's: A sensitive tool for characterizing the buried Si/SiO2 interface

IEEE International SOI Conference

Volumn , Issue , 1999, Pages 52-53

  Zhao, Xuejun ^a   Ioannou, Diminis E ^a  

^a GEORGE MASON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HOT CARRIERS; INTERFACES (MATERIALS); MOSFET DEVICES; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DIODES; SILICA; SILICON WAFERS;

BACK CHANNEL LEAKAGES; BACK-GATE VOLTAGES;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0033324757     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)