XTEM study of Al doped TiO2 anatase epitaxial films deposited on MgO by pulsed laser deposition

Journal of Materials Science

Volumn 34, Issue 22, 1999, Pages 5469-5476

  Teodorescu, V S ^a   Blanchin, M G ^b   Garapon, C ^b   Champeaux, C ^c  

^a NATIONAL INSTITUTE OF MATERIALS PHYSICS   (Romania)

^b UNIVERSITÉ LYON 1   (France)

^c UNIVERSITY OF LIMOGES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CRYSTAL MICROSTRUCTURE; DEPOSITION; EPITAXIAL GROWTH; INTERFACES (MATERIALS); MAGNESIA; MORPHOLOGY; OPTICAL PROPERTIES; PULSED LASER APPLICATIONS; SINGLE CRYSTALS; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY;

ANATASE FILM; COLUMNAR MORPHOLOGY; CROSS SECTION TRANSMISSION ELECTRON MICROSCOPY; PULSED LASER DEPOSITION;

THIN FILMS;

EID: 0033324158     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004796008417     Document Type: Article

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