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Volumn 259, Issue 1-3, 1999, Pages 81-86
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Development of a wide-temperature range VUV and UV spectrophotometer and its applications to silica glass
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION SPECTROSCOPY;
BAND STRUCTURE;
DEFECTS;
FUSED SILICA;
HIGH TEMPERATURE EFFECTS;
OPTICAL GLASS;
PHOTONS;
RADIATION DAMAGE;
THERMODYNAMIC STABILITY;
VACUUM TECHNOLOGY;
URBACH EDGE;
ULTRAVIOLET SPECTROPHOTOMETERS;
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EID: 0033323533
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(99)00499-8 Document Type: Article |
Times cited : (10)
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References (18)
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