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Volumn 38, Issue 10, 1999, Pages 5768-5771

Structural inhomogeneity in hydrogenated amorphous silicon in relation to photoelectric properties and defect density

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CATHODES; CRYSTAL DEFECTS; DEGRADATION; ELECTRIC CURRENTS; ELECTRON SPIN RESONANCE SPECTROSCOPY; HYDROGENATION; PHOTOELECTRICITY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING FILMS; X RAY SCATTERING;

EID: 0033323503     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.5768     Document Type: Article
Times cited : (7)

References (29)
  • 6
    • 0002522153 scopus 로고
    • eds. D. Adler and H. Fritzsche Plenum Press, New York and London
    • W. Beyer: Tetrahedrally-Bonded Amorphous Semiconductors, eds. D. Adler and H. Fritzsche (Plenum Press, New York and London, 1985) p. 129.
    • (1985) Tetrahedrally-Bonded Amorphous Semiconductors , pp. 129
    • Beyer, W.1
  • 16
    • 0021564913 scopus 로고
    • ed. J. I. Pankove Academic Press, London, Chap. 3
    • P. C. Taylor: Semiconductors and Semimetals, ed. J. I. Pankove (Academic Press, London, 1984) Vol. 21 C, Chap. 3, p. 99.
    • (1984) Semiconductors and Semimetals , vol.21 C , pp. 99
    • Taylor, P.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.