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Volumn 38, Issue 10, 1999, Pages 5768-5771
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Structural inhomogeneity in hydrogenated amorphous silicon in relation to photoelectric properties and defect density
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS SILICON;
CATHODES;
CRYSTAL DEFECTS;
DEGRADATION;
ELECTRIC CURRENTS;
ELECTRON SPIN RESONANCE SPECTROSCOPY;
HYDROGENATION;
PHOTOELECTRICITY;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SEMICONDUCTING FILMS;
X RAY SCATTERING;
DEFECT DENSITY;
ION FLUX IMPINGING;
LIGHT-INDUCED DEGRADATION;
SMALL-ANGLE X RAY SCATTERING;
STRUCTURAL INHOMOGENEITY;
SEMICONDUCTING SILICON;
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EID: 0033323503
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.38.5768 Document Type: Article |
Times cited : (7)
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References (29)
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