Structural characterization of chalcogenide planar waveguide materials using near-infrared Raman spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3849, Issue , 1999, Pages 74-84

  Richardson, Kathleen A ^a   Zollinger, Kevin ^a   Evans, Jennifer ^a   Marchivie, Mathieu ^a   Schulte, Alfons ^a   Cardinal, Thierry ^a   Meneghini, Chiara ^a   LeFoulgoc, Karine ^a   Saliminia, Ali ^a   Glastyan, Tingran ^a   Villeneuve, Alain ^a  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED RADIATION; INFRARED SPECTROSCOPY; OPTICAL FILMS; OPTICAL WAVEGUIDES; RAMAN SPECTROSCOPY;

CHALCOGENIDE GLASS; NEAR-INFRARED RAMAN SPECTROSCOPY;

OPTICAL GLASS;

EID: 0033323008     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (26)