Preparation and femtosecond third-order nonlinear optical properties of Cu/SiO2 composite thin films

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 9 A, 1999, Pages 5079-5082

  Tanahashi, Ichiro ^a   Inouye, Hideyuki ^b   Tanaka, Koichiro ^c   Mito, Akihiro ^d  

^a PANASONIC CORPORATION   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c KYOTO UNIVERSITY   (Japan)

^d NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Cu particle; Pump probe method; Third order optical nonlinearity; Z scan

Indexed keywords

ABSORPTION SPECTROSCOPY; COMPOSITE MATERIALS; COPPER; FUSED SILICA; LIGHT ABSORPTION; NONLINEAR OPTICS; OPTICAL PROPERTIES; SPUTTERING; THIN FILMS; ULTRAFAST PHENOMENA;

SURFACE PLASMON RESONANCE; THIRD-ORDER NONLINEAR SUSCEPTIBILITY;

OPTICAL FILMS;

EID: 0033322918     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.5079     Document Type: Article

References (23)

1. D. Ricard, P. Roussignol and C. Flytzanis: Opt. Lett. 10 (1985)511.
2. E. J. Heolweil and R. M. Hochestraacr: J. Chcm. Phys. 82 (1985) 4762.
3. K. Uchida, S. Kancko, S. Omi, C. Hata, H. Tanji, Y. Asahara, A. Ikushima, T. Tokizaki and A. Nakamura: J. Opt. Soc. Am. B 11 (1994) 1236.
4. S. D. Stookey: J. Am. Ccram. Soc. 32 (1949) 246.
5. R. D. Maurer: J. Appl. Phys. 29 (1958) 1.
6. J. Malsuoka, R. Mizutani, S. Kaneko, H. Nasu, K. Kamiya, K. Kadono, T. Sakaguchi and M. Miya: J. Ceram. Soc. Jpn. 101 (1993) 53.
7. I. Tanahashi and T. Mitsuyu: J. Non-Cryst. Solids 181 (1995) 77.
8. G. W. Arnold and J. A. Borders: J. Appl. Phys. 48 (1977) 1488.
9. K. Fukumi, A. Chayahara, K. Kadono, T. Sakaguchi, G. Horino, M. Miya, J. Hayakawa and M. Satou: Jpn. J. Appl. Phys. 30 (1991) 742.
10. L. Yang, D. H. Osborne, R. F. Haglund, Jr., R. H. Magruder, C.'W. White, R. A. Zuhr and H. Hosono: Appl. Phys. A 62 (1996) 403.
11. T. Akai, K. Kadono, H. Yamashita, T. Sakaguchi, M. Miya and H. Wakabayashi: J. Ccram. Soc. Jpn. 101 (1993) 105.
12. I. Tanahashi, Y. Manabe, T. Tohda, S. Sasaki and A. Nakamura: J. Appl. Phys. 79 (1996) 1244.
13. I. Tanahashi, M. Yoshida, Y. Manabe, T. Tohda, S. Sasaki, T. Tokizaki and A. Nakamura: Jpn. J. Appl. Phys. 33 (1994) L1410.
14. J. M. Ballesteros, R. Serna, J. Sous, C. N. Afonso, A. K. Pelford-Long, D. H. Osborne and R. F. Haglund, Jr.: Appl. Phys. Lett. 71 (1997) 2445.
15. C. N. Afonso, R. Scma, J. M. Ballesteros, A. K. Pelford-Long and R. C. Doole: Appl. Surf. Sci. 127-129 (1998) 339.
16. P. Scherrer: Nachr. Ges. Wiss. Gottingen. 2 (1918) 96.
17. A. Mito, K. Hagimoto and C. Takahashi: Nonlinear Opt. 13 (1995) 3.
18. D. Milam: Appl. Opt. 37 (1998) 546.
19. C. D. Wagner: Handbook of X-ray Plioioelectwn Spearoscopy, ed. G. E. Mullenberg (Perkin-Elmcr, 1979).
20. M. Sheik, A. A. Said, T. H. Wei, D. J. Hagan and E. W. Van Stryland: IEEE J. Quantum Electron. 26 (1990) 760?
21. Y. M. Chcung and S. K. Gayen: J. Opt. Soc. Am. B 11 (1994) 636.
22. H. Inouye, K. Tanaka, I. Tanahashi and K. Hirao: Phys. Rev. B 57 (1998) 11334.
23. T. Tokizaki, A. Nakamura, S. Kaneko, K. Uchida, S. Omi, H. Tanji and Y. Asahara: Appl. Phys. Lett. 65 (1994) 941.