Enhanced skin effect for partial element equivalent circuit (PEEC) models

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn , Issue , 1999, Pages 189-192

  Coperich, Karen M ^a   Ruehli, Albert E ^a   Cangellaris, Andreas ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS; MATHEMATICAL MODELS; SKIN EFFECT;

PARTIAL ELEMENT EQUIVALENT CIRCUITS (PEEC); VOLUME FILAMENT TECHNIQUES;

EQUIVALENT CIRCUITS;

EID: 0033322212     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (6)