SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 433, Issue , 1999, Pages 632-636

Reconstruction of the Si(113) surface studied by transmission electron diffraction

(4) Ikeda, H a Oshima, Y a Hirayama, H a Takayanagi, K a

a TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ELECTRON BEAMS; ELECTRON DIFFRACTION; HIGH TEMPERATURE OPERATIONS; MATHEMATICAL MODELS; PHASE TRANSITIONS; QUENCHING; SEMICONDUCTING SILICON; SURFACE STRUCTURE; THIN FILMS;

DABROWSKI MODELS; PATTERSON MAP; RANKE MODELS; SURFACE RECONSTRUCTION; TRANSMISSION ELECTRON DIFFRACTION;

SURFACE TREATMENT;

EID: 0033321986 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(99)00480-X Document Type: Article

Times cited : (5)

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