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Transactions of the Institute of Metal Finishing

Volumn 77, Issue 6, 1999, Pages 226-229

Characterisation of a RuO2 film thermally deposited on a titanium support

(4) Yang, L X a Fair, J P G a Ashworth, M A b Charnock, J M c

a School of Metallurgy and Materials (United Kingdom)

b UNIVERSITY OF BIRMINGHAM (United Kingdom)

c DARESBURY LABORATORY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CALCINATION; CRYSTAL STRUCTURE; ELECTROCHEMICAL ELECTRODES; ELECTRODEPOSITION; THERMAL EFFECTS; TITANIUM; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY;

EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY; RUTHENIUM DIOXIDE;

RUTHENIUM COMPOUNDS;

EID: 0033321959 PISSN: 00202967 EISSN: None Source Type: Journal
DOI: 10.1080/00202967.1999.11871289 Document Type: Article

Times cited : (6)

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