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Volumn , Issue , 1999, Pages 101-109
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Low-cost test for large analog IC's
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMAGNETIC WAVE PROPAGATION;
FOURIER TRANSFORMS;
INTEGRATED CIRCUIT TESTING;
SEMICONDUCTOR DEVICE MODELS;
ANALOG INTEGRATED CIRCUITS;
DISCRETE FOURIER TRANSFORMS (DFT);
LINEAR INTEGRATED CIRCUITS;
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EID: 0033320811
PISSN: 10636722
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (9)
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