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Volumn 433, Issue , 1999, Pages 590-594
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Quantitative analysis of EELS spectra on the growth of C60 thin film on graphite
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTIFICIAL GRAPHITE;
COMPUTER SIMULATION;
ELECTRODYNAMICS;
ELECTRON ENERGY LOSS SPECTROSCOPY;
ELECTRON SCATTERING;
FULLERENES;
MATHEMATICAL MODELS;
MOLECULES;
REACTION KINETICS;
SPECTRUM ANALYSIS;
SUBSTRATES;
TEMPERATURE;
DEGREE OF INTERLAYER TRANSPORT;
MODEL OF SURFACE KINETICS;
RATE EQUATION;
SCATTERING DYNAMICS;
THIN FILMS;
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EID: 0033320778
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(99)00031-X Document Type: Article |
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Times cited : (6)
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References (7)
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