Determining capacity loss from operational and technical deployment practices in a semiconductor manufacturing line

1999 IEEE International Symposium on Semiconductor Manufacturing, ISSM 1999 - Conference Proceedings

Volumn , Issue , 1999, Pages 3-5

  Marcoux, P ^a   McClintock, M ^a   Martin, D ^a   Woods, R ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MANUFACTURE; DATA REDUCTION; INDUSTRIAL ELECTRONICS; PLANT MANAGEMENT;

CAPACITY LOSS; DATA ANALYSIS SYSTEM; IDLE TIME; SEMICONDUCTOR MANUFACTURING LINE; TEAM WORK;

SEMICONDUCTOR DEVICE MANUFACTURE;

OPERATIONAL DEPLOYMENT PRACTICES; SEMICONDUCTOR MANUFACTURING LINES; TECHNICAL DEPLOYMENT PRACTICES;

EID: 0033320647     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSM.1999.808724     Document Type: Conference Paper

References (2)

1. Martin, D. P. , "Total Operational Efficiency (TOE): The Determination of Capacity and Cycle Time Components and Their Relationship To Productivity Improvcments in a Semiconductor Manufacturing Line, " Procccdings of the ASMC, September, 1999, Boslnn , MA.
2. Martin, D. P. , "Capacity and Cycle Time-Throughput Understanding System (CAC-TUS): An Analysis Tool To Determine the Cinnponents OS Capacity and Cycle Time in a Semiconductor Manuklcturing Line, " Proceedings of the ASMC, September, 1999, Boston, MA.