X-ray scatter measurements from thermally slumped thin glass substrates for the HEFT hard x-ray telescopes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3766, Issue , 1999, Pages 184-196

  Hussain, Ahsen M ^a   Christensen, Finn E ^a   Jimenez Garate, Mario A ^a   Craig, William W ^a   Hailey, Charles J ^a   Decker, Todd R ^a   Stern, Marcela ^a   Windt, David L ^a   Mao, Peter H ^a   Harrison, Fiona A ^a   Pareschi, Giovanni ^a   Sanchez del Rio, Manuel ^a   Souvorov, Alexei ^a   Freund, Andreas K ^a   Tucoulou, Remi ^a   et al , ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTOMETERS; MIRRORS; MULTILAYERS; OPTICAL TELESCOPES; OPTICAL TESTING; OPTICS; REFLECTION; SUBSTRATES; SURFACE ROUGHNESS; SURFACES; SYNCHROTRON RADIATION; X RAY SCATTERING;

ANODE X RAY SOURCE; HALF POWER DIAMETERS; HARD X RAY TELESCOPES; THERMALLY SLUMPED THIN GLASS SUBSTRATE; X RAY DIFFRACTOMETERS; X RAY GRAZING INCIDENCE OPTICS; X RAY SCATTERING MEASUREMENT; X RAY SPECULAR REFLECTIVITY MEASUREMENT;

GLASS;

EID: 0033318638     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)