Optimization of TXRF measurements by variable incident angles

Spectrochimica acta, Part B: Atomic spectroscopy

Volumn 54, Issue 10, 1999, Pages 1505-1511

  Prange, A ^a   Reus, U ^a   Schwenke, H ^a   Knoth, J ^a  

^a INSTITUTE OF MATERIALS RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; FLUORESCENCE; IRON; LIGHT REFLECTION; OPTIMIZATION; POTASSIUM; SUSPENSIONS (FLUIDS); TITANIUM; TRACE ANALYSIS; TRACE ELEMENTS; X RAY SPECTROSCOPY;

TOTAL-REFLECTION X RAY FLUORESCENCE (TRXF) SPECTROMETRY;

SPECTROMETRY;

EID: 0033318241     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0584-8547(99)00106-8     Document Type: Article

References (4)

1. Knoth J., Prange A., Schneider H., Schwenke H. Variable X-ray excitation for TXRF using a Mo/W-Alloy anode and a tunable double multilayer monochromator. Spectrochim. Acta Part B. 52:1997;907-913.
2. Klockenkämper R., Knoth J., Prange A., Schwenke H. Total reflection X-ray fluorescence spectroscopy. Anal. Chem. 64:1992;1115A-1121A.
3. Prange A., Kramer K., Reus U. Boron nitride sample carriers for TXRF. Spectrochim. Acta Part B. 48:1993;153-161.
4. Klockenkämper R. Total Reflection X-ray Fluorescence Analysis. 1997;John Wiley and Sons, New York.