Structure-electrical properties relationships in TiO2-doped stabilized tetragonal zirconia ceramics

Ceramics International

Volumn 25, Issue 7, 1999, Pages 639-648

  Capel, F ^a   Moure, C ^a   Duran P ^a   Gonzalez Elipe A R ^b   Caballero, A ^b  

^a INSTITUTO DE CERÁMICA Y VIDRIO   (Spain)

^b CSIC JA USE Centro de Investigaciones Cientificas Isla de la Cartuja CICIC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; DIFFUSION IN SOLIDS; ELECTRIC CONDUCTIVITY OF SOLIDS; IONIC CONDUCTION IN SOLIDS; MOLECULAR STRUCTURE; SINTERING; SOLID SOLUTIONS; SUBSTITUTION REACTIONS; TERNARY SYSTEMS; TITANIUM OXIDES; X RAY DIFFRACTION ANALYSIS; ZIRCONIA;

CATION OXYGEN VACANCY; NON RANDOM SUBSTITUTION; TITANIA DOPED STABILIZED TETRAGONAL ZIRCONIA CERAMIC; X RAY ABSORPTION;

CERAMIC MATERIALS;

EID: 0033318144     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0272-8842(98)00078-9     Document Type: Article

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