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Volumn E82-C, Issue 4, 1999, Pages 582-588

A complete methodology for electro-mechanical characterization of a CMOS Compatible MEMS Technology

Author keywords

Analytical modeling; Characterization; Micro electro mechanical systems; Monolithic integration

Indexed keywords

CMOS INTEGRATED CIRCUITS; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; MONOLITHIC INTEGRATED CIRCUITS; SENSORS; VLSI CIRCUITS;

EID: 0033317730     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (9)

References (17)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.