Comparisons of particle tracking and charge deposition schemes for a finite element gun code

IEEE International Conference on Plasma Science

Volumn , Issue , 1999, Pages 212-

  Nelson, E M ^a   Eppley, K R ^a   Petillo, J J ^a   Humphries Jr , S ^a  

^a Field Precision   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSTRACT ONLY; FINITE ELEMENT GUN CODE;

CHARGED PARTICLES; FINITE ELEMENT METHOD; MATHEMATICAL MODELS;

ELECTRON GUNS;

EID: 0033317313     PISSN: 07309244     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)